Zeiss Field Emission Scanning Electron Microscope Supra 40VP

Zeiss Scanning Electron Microscope

Here we offer you a used Zeiss scanning electron microscope.

Field Emission Scanning Electron Microscope Zeiss Supra 40VP

The field emission scanning electron microscope Supra 40VP allows for analysis

and imaging of samples in high vacuum and variable pressure conditions with a spatial resolution of up to 1.3 nm.

The variable pressure range also enables the examination of non-conductive samples.

The device is equipped with the following detectors:

Secondary Electron Detector (SE) for high vacuum operation
VPSE Detector for variable pressure range
Inlens Secondary Electron Detector
Backscattered Electron Detector (BSD)

Equipment:

Carl Zeiss Supra 40VP
Gemini Optics
Panasonic CCTV Camera WV-BP332EE
EDWARDS Oil-free dry-running scroll pump
EDX Detector
STEM Detector

Maximum resolution: 1 nm
Magnification range: 12x - 900,000x
Acceleration voltage: max. 30 kV
Software: SmartSEM

Type: Zeiss Supra 40VP

Scope of delivery: (See photos)

Condition: used

(Changes and errors in technical data are reserved!)

Please inquire about transport options before purchase.

We would be happy to answer any further questions by phone.