Zeiss Scanning Electron Microscope EVO 40 XVP

Zeiss Scanning Electron Microscope

Here we offer you a used Zeiss scanning electron microscope.

Scanning Electron Microscope Zeiss EVO 40 XVP

Powerful, computer-controlled digital SEM for versatile applications, including turbomolecular pump and chamber design for analytics.

The SEM can be operated in both high vacuum (HV) and extended variable pressure (XVP).

Technical specifications:

Commissioning: 2005
Electron source: Tungsten cathode
Acceleration voltage: 0.2 to 30 kV
Magnifications: 7 to 1,000,000 times
Resolution: 3.0 nm (at 30 kV)
Detectors:

1. Everhart-Thornley Secondary Electron Detector

2. 4Q-BSD (4 Quadrant Backscattered Electron Detector)

3. VPSE (Variable Pressure Secondary Electron Detector)

Sample chamber: 310 mm (Ø) x 220 mm (height)
Sample stage: 5 motorized axes (X = 80 mm, Y = 80 mm, Z = 35 mm, R = 360°
Tilting = 0 – 90°, motor control via mouse or joystick
Image resolutions: up to 3072 x 2304 pixels (standard: 1024 x 768 pixels)
Microscope operation: All SEM functions are controlled via a PC with Windows, 24-inch flat screen

In 2015, a comprehensive modernization was carried out, during which two prone-to-failure circuit boards were replaced.

In addition, the system received a new PC and the latest software for operating the SEM at that time.

The current operating system is Windows 7 Professional.

Special features:

Both the SEM and the PC control itself operate very stably!

The functional device also includes about 50 W-cathodes and a factory-sealed high vacuum pump (turbomolecular) as a spare part.

Type: Zeiss EVO 40 XVP

Scope of delivery: (See photos)

Condition: used

(Changes and errors in the technical data are reserved!)

Please inquire about transport options before purchase.

We are happy to answer any further questions by phone.