LEO ZEISS Scanning Electron Microscope SEM 1450VP with X-ray Source iMOXS

LEO ZEISS Scanning Electron Microscope

Here we offer you a scanning electron microscope with X-ray microanalysis.

Scanning electron microscope with X-ray microanalysis LEO 1450VP from Zeiss.

Scanning electron microscopes (SEM) from ZEISS provide high-resolution surface information and excellent material contrast.

They are used in material analysis, nanotechnology, semiconductor failure analysis, life sciences, and quality assurance.

TECHNICAL DATA:

Manufacturer: LEO / ZEISS
Model: 1450VP
Category: Scanning Electron Microscope
Features:
Scanning Electron Microscope (SEM)
W-Cathode
1-30kV Voltage
3.5nm Resolution
1pA-1μA Beam Current
Backscattered Electron Detector (BSE)
Low Vacuum Detector (VPSE)
With the modular X-ray source iMOXS SEM IfG Modular X-ray MCBM 50-0.6B
Modes with variable pressure and high pressure
van der Heijden Cooler
Pump: EDWARDS RV12 Rotary Pump
Titan-DIG MV Framegrabber
PCB, CPL Stage Control
6-Axis with Program
EO Board
PCB Power Supply

EDAX:
10 mm² Detector Area
125 eV Energy Resolution
15 Working Distance

Voltage: LEO 1450VP 1/N/PE 208…240V 50…60 HZ max. 16A

Operating System: Windows 7 and Smart SEM Software

Upgraded:
With the modular X-ray source iMOXS SEM

With the modular X-ray source iMOXS (IfG Modular X-ray Source), you can easily expand the functions of your scanning electron microscope (SEM).

iMOXS utilizes the existing detector of the electron microscope and can be combined with all common SEM types with minimal effort through the chosen flange.

Between the electron source of the SEM and the additional X-ray source, you can examine samples with X-ray fluorescence analysis and electron beam microanalysis using a single device.

By leveraging the advantages of both methods, you can detect elements in small concentrations with very high resolution.

Applications:

SEM Mapping: quick overview of the elemental composition of a sample; finds elements that are hidden from the SEM
Failure analysis, testing for material failure and material fatigue
Material analysis directly in the SEM, for example, determining the Si and Zn content in aluminum alloys
Forensic analyses
Detection of trace elements in the ppm range
Detection of heavy elements (Z > 18)

Stage: 5 axes, motorized

(x,y,z, rotation, tilting)

Type: LEO 1450VP

Condition: used

Scope of delivery: LEO 1450VP, vacuum pump, monitors, PC, keyboard, software documents

(Changes and errors in the technical data are reserved!)

We would be happy to answer any further questions by phone.