Jeol Scanning Electron Microscope SEM JSM-6400
Item ID: 20294
Condition: Used
Stock: Only ${ $store.getters['20294/currentItemVariation'].stock.net } in stock
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Jeol
Here we offer you a scanning electron microscope.
The Jeol JSM-6400 is a SEM configured with an energy-dispersive X-ray analyzer (EDS system) from Oxford.
SEM is a method for high-resolution imaging of surfaces.
A beam of electrons is scanned over the surface of the sample, and the resulting electrons emitted from the sample
are attracted and collected by a detector and converted into a signal.
Imaging in a SEM can be done using secondary electrons to obtain fine topographical surface features
or with backscattered electrons, which provide contrast based on atomic number.
The EDS analysis system allows the SEM to perform an analysis of the composition of samples.
Specifications
Resolution:
3.5 nm guaranteed (35 kV, WD = 8 mm)
Magnification:
x10 (WD = 39 mm) to 300,000
Imaging modes:
Secondary electron image (SEI)
Backscattered electron image (BEI (composition, topography))
Electron channeling pattern (ECP)
Acceleration voltage:
0.2 to 5 kV (100 V steps)
5 to 40 kV (1 kV steps)
Probe current:
10-12 to 10-5 A
Autofocus:
Built-in
Auto Stigmator:
Built-in
Automatic contrast and brightness control:
Built-in
Condition memory functions:
For each operator or sample, 10 sets of the following parameters can be read in and out
Acceleration voltage/Bias/Probe current/Stigmator/Magnification/Focusing/Image contrast and brightness of SEI
Image processing system
Image memory: 1,024 x 1,024 x 8 Bit x 4 Frames (19 Frames with optional hard drive)
Buffer memory: 512 x 512 x 16 Bit x 2 Frames
Functions: Averaging, Integration, Pixel accumulation, 2-Division display, 4-Division display,
Histogram, Image conversion, Frame-to-Frame calculation
Full keyboard
Various functions can be executed via menu selection or command input through the keyboard
External control (option)
Controls executable via the full keyboard can also be executed externally via RS-232C
Object table
Fully eucentric goniometer table
Sample movements: X = 50 mm, Y = 70 mm, Z = 40 mm (fine Z = + 2 / -3 mm), T = -5 ° to + 90 °, R = 360 ° continuous
Installation requirements
Power: Single-phase, 50/60 Hz, 240/220/200/180 V AC, 6 kVA
Water: 5 l/min or more
Dry nitrogen gas: Should be provided by the customer.
Temperature: 20 ± 5 °C
Humidity: 60% or less
Weight approx. 880 kg
Room size: Approx. 2,700 mm x 3,200 mm or more
Operating system
DIPS: Windows 7, EDX: Windows 2000
Type: JSM-6400
Scope of delivery: (Jeol JSM-6400 with accessories as shown)
Condition: used
(Changes and errors in technical data are reserved!)
Please inquire about transport options before purchase.
We would be happy to answer any further questions by phone.
| Technical characteristic | Value |
|---|---|
| Item ID | 20294 |
| Condition | Used |
| Model | Jeol JSM-6400 REM SEM |
| Manufacturer | JEOL |
| Content | 1 piece |
| Weight | 800000 g |
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Manufacturer details
JEOL
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