Jeol Scanning Electron Microscope (PC-SEM) JSM-6490 Bruker XFlash Detector

Jeol

Type: Jeol JSM-6490

Jeol Scanning Electron Microscope

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)
Modern, high-resolution, digital scanning electron microscope
with newly developed electron optics and intuitive,
graphical user interface (GUI) under Microsoft Windows XP Professional.

Equipment features including the following specifications:

Magnification range: 5 X - 300,000 X
Acceleration voltage 0.3 - 30 kV
Tungsten hairpin cathode (LaB6 cathode optional)
Large fully motorized sample stage with eccentric tilting, including
Graphical navigation on the sample holder
Easy sample navigation through click-center-zoom
Field-of-view controlled navigation via 2 navigators
Relative coordinates navigation
Saving and recalling sample positions
Adjustable image cropping method of the sample stage
Field-of-view correction during rotation via computer-controlled eccentric rotation
Field-of-view correction during tilting via computer-controlled eccentric tilting
Calculation of the possible tilt angle based on sample geometry
Automatic focus tracking during sample movement in Z-direction
Intelligent limit switches for the motorized axes

Travel range of the sample stage:
x=125mm
Y=100mm
z = 5 to 80 mm (continuously adjustable)
T = -10°C to +90°C
R= 360°C (continuous)
Secondary electron detector for high vacuum operation
Novel, super-conical objective lens guarantees highest
image resolution even at large tilt angles
Guaranteed resolution in SE image: 3 nm at 30 kV and
15 nm at 1 kV
Simultaneous live image display from multiple detectors
Easy sample navigation through click-center-zoom
Powerful image measurement functions
Movie function for capturing dynamic processes
Versatile sample chamber with numerous
expansion options: free flanges for EDX, WDX,
EBSD, cathodoluminescence, etc.
Maintenance-free, low-wear, quiet pumping system
consisting of a backing pump, vibration-free high-performance diffusion pump
and electromagnetic valve control
Extensive error protection against operator errors
and failure of external media
Ergonomic, height-adjustable system table
SEM starter kit consisting of 2 sample holders,
tool set, and 6 replacement cathodes

Additional equipment for scanning electron microscope

Turbo molecular pump
instead of the standard diffusion pump
When using a turbo molecular pump, no cooling water is required for the
operation of the SEM.

Further SEM equipment:

PC for controlling the SEM
including TFT monitor

ΟΧ200 Bruker Quantax 200 EDX System EXTENDED

Bruker EDX software will be transferred to the new owner after purchase!

Nitrogen-free, energy-dispersive X-ray analysis system
including:

SDD detector with 127 eV or better energy resolution
Detection of all elements from boron
Vibration-free, maintenance-free. Peltier cooled (nitrogen-free)
Pulse processor
TFT monitor
Spectrum measurement and element identification
Fully automatic, quantitative, standard-free
element analysis
Image acquisition
Super-fast qualitative line scan
Super-fast qualitative element mapping
Data management and archiving system
Report generation and result output
Data communication
Installation and training
HyperMap
Multipoint analysis

Bruker xFlash detector (SDD) with signal processing unit SVE III

Scope of delivery: (See photos)

Condition: used

(Changes and errors in technical data are reserved!)

Please inquire about transport options before purchase.

We would be happy to answer any further questions by phone.