J.A. Wolllam Co., Inc. - Spectroscopic Ellipsometer AccuMap-SE V-15
Item ID: 13230
Condition: Used
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J.A. Wolllam Co., Inc. - Spectroscopic Ellipsometer
Here we offer a J.A. Wolllam Co., Inc. - Spectroscopic Ellipsometer.
J.A. Wolllam Co., Inc. - Spectroscopic Ellipsometer
Characterization of thin film uniformity on large plates is now even easier.
The AccuMap-SE combines high-speed M2000 spectroscopic ellipsometry with fast mapping for large plates.
Gain confidence in your coatings that only accurate spectroscopic ellipsometry measurements can provide.
The wide spectral range of the M-2000 is well-suited for all thin films in photovoltaic and flat panel display applications.
Complete system consisting of light source, detector unit, mapping platform, and
computer for ellipsometry on samples with edge lengths up to 1000 mm x 500 mm, CE marked.
System data:
Light source: M-2000 50W FQTH (370nm – 1690nm)
Connection: 200-240VAC, 50/60Hz, 20A (max)
Dimensions: 2466 W x 594 D x 2000 H
Weight: 600 kg
Device description and documentation fully available.
Type: AccuMap-SE V-15
Condition: used
Scope of delivery: (See image)
(Changes and errors in technical data are reserved!)
We would be happy to answer any further questions by phone.
Written orders possible via email or fax
| Technical characteristic | Value |
|---|---|
| Item ID | 13230 |
| Condition | Used |
| Model | Spektroskopischer Ellipsometer AccuMap-SE V-15 |
| Manufacturer | J.A. Wolllam Co., Inc. |
| Content | 1 piece |
| Weight | 600000 g |
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Manufacturer details
J.A. Wolllam Co., Inc.
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