Helmut Fischer FISCHERSCOPE X-RAY XDLM 237 X-ray fluorescence device for layer thickness measurement

FISCHER

FISCHERSCOPE X-RAY XDLM 237 – X-ray fluorescence device for layer thickness measurement
Calibration standards, PC with WinFTM
with software: WinFTM XDLM-237 EDXRE Version 6.33

Fully automatic XRF measurement system for precise layer thickness analysis and material testing

Device description:

For sale is a used FISCHERSCOPE X-RAY XDLM 237
a high-quality, energy-dispersive X-ray fluorescence device (EDXRF)
for non-destructive layer thickness measurement and material analysis.
The device is specifically designed for the requirements in electroplating,
electronics manufacturing, and quality assurance in series production.

The fully automatic XY measuring table, the top-down measurement direction, and
the small measurement spot enable precise analyses even for small, uneven, or complex test objects.

Typical areas of application
Electroplating: layer thicknesses such as Zn/Fe, Ni/Cu, Cr/Ni, etc.
Electronics: contacts & printed circuit boards (e.g., Au/Ni/Cu, Sn/Cu)
Tool coating: PVD/CVD layers on hard metal
Material analysis: analysis of alloys, baths, or liquids
Quality assurance: series testing with automatic process

Conclusion:

The XDLM 237 is excellent for:
high-precision layer thickness measurements
automated testing processes
measurement of small areas & irregular geometries
high-quality laboratory or manufacturing environments

Technical highlights:

Model: FISCHERSCOPE X-RAY XDLM 237
Measurement direction: from above (Top-Down)
XY table: motorized & programmable, measurement range approx. 300 × 350 mm
Z-axis: 140 mm stroke, motorized
Measuring distance: 0–80 mm (automatic focus compensation – DCM method)
X-ray source: microfocus tungsten tube with beryllium window
Detector: proportional counter tube – fast signal processing
Aperture changer: 4-fold, e.g., Ø 0.1 mm, 0.05×0.05 mm
Filter changer: 3-fold (e.g., Ni, Al, empty)
Camera: high-resolution video camera with zoom & crosshair
Software: WinFTM XDLM-237 EDXRE Version 6.33
Dimensions approx. 570×760×650 mm
VAC(VDC) 230 V
Hz 50-60 Hz
VA(A) 120 W

Weight approx. 120 kg

Condition: used

Scope of delivery:

FISCHERSCOPE X-RAY XDLM 237 (used device)
Calibration standards, PC with WinFTM
with software: WinFTM XDLM-237 EDXRE Version 6.33
Power connection cable
User manual (printout)

(Changes and errors in technical data are reserved!)

Do you have questions?
Please feel free to contact us for more information or an individual shipping price.