PANalytical X’Pert PRO MPD X-ray diffractometer (XRD)
Item ID: 24688
Condition: Used
Stock: Only ${ $store.getters['24688/currentItemVariation'].stock.net } in stock
EUR 13,500.00
*
Content
1 piece
Unit price
EUR 13,500.00 / piece
The item is in stock
PAYMENT METHODS:
²

* Excl. VAT excl. Shipping
PANalytical
PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD)
Excerpt from the service report:
Device: PANalytical X’Pert PRO MPD
Created on: 07.07.2021
Performed work:
- Reassembly and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete adjustment of goniometer and other components
- Maintenance including replacement of defective parts
Used spare parts:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT FAN
FILTER FILTER, WATER
Motor PW3050
(“Device was not tested in-house”)
The X’Pert PRO MPD is a very versatile and powerful X-ray diffractometer (XRD)
for the structural characterization of crystalline materials.
– perfect for pure research as well as for routine applications in industry
and university. Thanks to its modular design, fast detection, temperature and
atmosphere control, it is excellently suited for both routine analyses and complex
in-situ experiments.
Key features:
Different measurement geometries possible:
Reflection in Bragg-Brentano (θ–2θ) mode
Transmission geometry for powders in capillaries
Optional SAXS (Small-Angle X-ray Scattering) for nanostructures
Radiation source and detectors:
Mostly copper anode (Cu-Kα, λ ≈ 1.54 Å)
X’Celerator detector (1D, ultra-fast) for parallel data acquisition
Modular system with PreFIX technology:
Quick change of optics and sample stages without recalibration
In-situ measurements at high temperatures:
Measurements up to approx. 1200°C possible
Controlled atmosphere: air, nitrogen, oxygen (reducing limited)
Typical applications:
Phase analysis and quantitative Rietveld evaluation
Determination of crystallite size, microdeformation, residual stresses
In-situ investigation of phase transitions, oxidation, crystallization, etc.
SAXS measurements for the analysis of nanoparticles, pore structures
Wide range of samples: powders, thin films, ceramics,
pharmaceuticals, catalysts, and much more.
Technical data (typical)
Property and specification
Angle range (20) approx. 0.5° to 150°
Step size up to 0.002° or finer
Goniometer vertical, 0–0, radius approx. 240 mm
Temperature range room temperature up to approx. 1200 °C
Atmosphere air, N₂, O₂ (reducing limited)
Detectors X’Celerator (1D), proportional counter
Distribution & locations of use:
The X’Pert PRO MPD is in use worldwide, e.g., at:
Universities (ETH Zurich, TU Dresden, University of Vienna)
Research institutes (e.g., Max Planck Institutes, ICN2, IS2M)
Industry (e.g., materials development, pharmaceuticals, chemistry)
Condition: used
Scope of delivery: (See image)
(Changes and errors in the technical data, specifications are subject to change!)
We would be happy to answer any further questions by phone.
| Technical characteristic | Value |
|---|---|
| Item ID | 24688 |
| Condition | Used |
| Model | PANalytical X’Pert PRO MPD |
| Manufacturer | PANalytical |
| Content | 1 piece |
| Weight | 1000000 g |
EU Responsible Person
Malvern Panalytical GmbH
Nürnberger Str. 113
34123 Kassel
Germany
info.de@malvernpanalytical.com
+49 561 5742 0
Manufacturer details
PANalytical
Malvern Panalytical GmbH
Germany
