Mahr Contour Measuring Device MarSurf XC 2 / ST750 with PC Form-PC Software and Accessories

Mahr Measuring Station

Here we offer you a Mahr  Contour Measuring Device .

Hard Stone Plate 700 mm x 550 mm (L x W) with three 10 mm wide T-slots

Measuring Column with electrically adjustable height range of 750 mm for the feed device

Measuring Stroke (in X) 0.2 mm to 120 mm
Measuring Range (in Z) 50 mm with 350 mm probe arm, 25 mm with 175 mm probe arm
Measuring System (in X) high-precision incremental measuring system (factory calibration with laser interferometer)
Measuring System (in Z) inductive transducer with high accuracy and linearity
Resolution (in Z) related to probe tip 0.38 μm with 350 mm probe arm, 0.19 μm with 175 mm probe arm
Resolution (in Z) related to measuring system 0.04 μm
Guide Deviation < 1 μm (over 120 mm)
Measuring Direction (in X) forward (+X), backward (-X)
Touch Direction (in Z) downward (-Z), upward (+Z)
Measuring Force (in Z) 1 mN to 120 mN, downward and upward (adjustable in MarSurf XC 2)
Scanning Angle on smooth surfaces depending on deflection: falling edges up to 88°, rising edges up to 77°
Measuring Speed (in X) 0.2 mm/s to 4 mm/s
Touch Speed (in Z) 0.1 mm/s to 1 mm/s
Positioning Speed (in X) and return speed 0.2 mm/s to 8 mm/s
Positioning Speed (in Z) 0.2 mm/s to 10 mm/s
Probe Arm Length 175 mm, 350 mm
Probe Tip Radius 25 μm

Measuring Station XC 2

Type: MarSurf XC 2 / ST750

Condition: used

Scope of Delivery: (See Image)

(Changes and errors in technical data are reserved!)
 
We would be happy to answer any further questions by phone.