Helmut Fischer FISCHERSCOPE X-RAY XDL 240 – X-ray fluorescence device for measuring layer thickness

Helmut Fischer

FISCHERSCOPE® X-RAY XDL® 240
X-ray fluorescence device for coating thickness measurement and elemental analysis

Description:
For sale is the FISCHERSCOPE® X-RAY XDL® 240, a high-precision X-ray fluorescence device (XRF),
used for measuring the thickness of coatings on various materials as well as for elemental analysis.
This instrument allows simultaneous analysis of up to 24 elements and is suitable for both
very thin coatings and the analysis of liquid samples such as electroplating baths.
The XDL® 240 is particularly well-suited for quality assurance and material analysis in industrial manufacturing processes.

Technical Features:

Tungsten X-ray tube with beryllium window for precise measurements up to 50 kV.
Collimation slit: 0.3 mm diameter for a precise focus on the measurement point.
Proportional detector: Enables high sensitivity and large window counting,
resulting in excellent photon capture.
Elemental analysis: Analysis of elements from titanium (22) to uranium (92).
Coating thickness measurement: Ideal for measuring extremely thin coatings
and quality control in large production volumes.

Protection system: IP40 – The device is robust and suitable
for use in hostile environments.

Additional Information:

Comes with a Windows-based computer.
Ideal for analyzing liquid samples such as electroplating baths
and measuring thin layers in manufacturing.
WinFTM Software Version 6.52 L

Dimensions and Weight:

Dimensions: 57.0 x 76.0 x 65.0 cm
Internal dimensions: 46.0 x 49.5 cm
(maximum sample height depending on configuration)

Power Supply:
Voltage: 100 - 240 V~ (AC)
Frequency: 50 - 60 Hz
Power consumption: 180 VA (Volt-Amperes)

Weight: 120 kg

Condition: used

Scope of delivery: (See image)

(Changes and errors in technical data are reserved!)

We would be happy to answer any further questions by phone.