Helmut Fischer Fischerscope X-Ray Fluorescence Coating Thickness Measurement XDL

Helmut Fischer

Here we offer you an X-ray fluorescence measuring device.

X-ray fluorescence measuring device (XRF) for manual or automated layer thickness measurement

of functional layers, corrosion protection layers, and bulk parts

Robust device for layer thickness measurement, also suitable for large measuring distances (DCM, stroke 0-80 mm)

Equipped with a fixed aperture and a fixed filter

For applications with measuring spot sizes from approx. 1 mm

Large, spacious measuring chamber with C-slot

Standard X-ray tube, proportional counter tube

Type: XDL-XYZpT8

Condition: used

Scope of delivery: (Fischerscope XDL with software and user manual as shown)

2 weeks startup warranty

The device comes from a stock clearance.

We also deliver with express shipping (DHL, UPS, TNT)
 
We are happy to answer any further questions by phone.

Written orders possible via email or fax