FRT MicroProf optical profilometer (2D) imaging measurement device (3D)

FRT MicroProf

Here we offer a topography measurement system from FRT.

The MicroProf is the measuring device for fast optical topography measurement on surfaces.
The device was specifically designed for daily industrial use: short measurement times,
large measurement ranges, and robust construction characterize the device.

The MicroProf operates as an optical profilometer (2D) and as an imaging measuring device (3D) using a
scanning method. Roughness and waviness can be determined in two and three dimensions according to
DIN EN ISO standards.

The sample is illuminated with focused white light when using the standard sensor FRT CWL.
From the reflected light, the sensor determines the structures on the sample at a working distance of 4mm.
Line and contour measurements in all directions, both in 2D and 3D mode,
characterize the MicroProf as a flexible and powerful measuring instrument.

max. height measurement range (depending on measuring head): 300µm to 3mm
local vertical resolution of the sensor: 10nm to 100nm
lateral resolution (depending on measuring head): 1-2µm
depending on the version, measurements up to 300 x 300 mm² on samples weighing up to 1 kg (values for standard device)

Software FRT Mark III Version 3.8

Type: MicroProf

Condition: used

Scope of delivery: (See image)

The device was in operation until disassembly.
 
If you have further questions, we would be happy to answer them by phone.

Written orders possible via email or fax